All m2c products and services will continue under the point electronic GmbH ownership. The integration between high performance imaging and control electronics with expert geometrical calibration and automation greatly strengthens the 3D and topography techniques in SEM, as well as expanding into new metrology and surface science applications. For more information look here and on the point electronic website
In cooperation with PTB (Physikalisch-Technische Bundesanstalt), m2c developed new roughness standards for high resolution surface measurement techniques. The desired roughness can be selected in an easy way and is used for the production with Focussed Ion Beam (FIB). Repeated profiles, well-known in 2D roughness measurement techniques, are also suitable for this processing technology. For more information, see: PTB Forschungsnachrichten
m2c 3D Topography (microShape) is now integrated in the DISS products of point electronic GmbH. This allows the upgrade of your SEM to a complete 3D topographic measurement system.
Ulrich Gernert's (TU Berlin) poster "Topographic contrast of HR-SEM" was awarded with the best poster price (Advances in Instrumentation, Detectors, FIB and Preparation) at the MC 2015 in Göttingen. For the presented evaluation of SEM image data, m2c software was enhanced with special radial histogram analysis.
M&A publication on "Automated Geometric SEM Calibration". See full paper here: Automated Geometric SEM Calibration