m2c microscopy measurement & calibration m2c microscopy measurement and calibration

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3D µ standards for optical microscopes
May 8, 2023

3D µ standards for optical microscopes

3D µ standards for optical microscopes. Results of the joint project between PTB and point electronic will be presented for the first time at the Control Fair 2023 (PTB stand, 9104).

3D µ standards for optical microscopes
Poster presentation Microscopy Conference 2023
February 27, 2023

New publication

Poster presentation at Microscopy Conference 2023 on "Using Machine Learning and Topographic SEM Imaging for Software Assisted Fractography"

Poster presentation Microscopy Conference 2023
Poster Nanoscale 2019
October 15, 2019

New publication

Poster contribution at Nanoscale 2019 with title: "Calibration of 3D reference standards using metrological large range AFM and calibrated confocal microscopy"

Poster Nanoscale 2019
DISS topography plugin with 3D calibration
October 23, 2018

3D calibration now integrated in DISS SEM control

M2C calibration technology is now integrated in Live-3D topography modul of DISS SEM control. The application of 3D calibration technology enables quantitative topography measurements with your SEM. All you need is DISS 3D topography extension for your SEM and an M2C calibration standard. Find further information on DISS 3D topography here.

DISS topography plugin with 3D calibration