October 23, 2018
3D calibration now integrated in DISS SEM control
M2C calibration technology is now integrated in Live-3D topography modul of DISS SEM control. The application of 3D calibration technology enables quantitative topography measurements with your SEM. All you need is DISS 3D topography extension for your SEM and an M2C calibration standard. Find further information on DISS 3D topography here.
May 25, 2018
Job offer for SEM service engineer and staff for electronic workshop.
We are looking forward to receive your application.
November 1, 2017
m2c now part of point electronic GmbH
All m2c products and services will continue under the point electronic GmbH ownership. The integration between high performance imaging and control electronics with expert geometrical calibration and automation greatly strengthens the 3D and topography techniques in SEM, as well as expanding into new metrology and surface science applications.
For more information look here
and on the point electronic website
December 2, 2016
New roughness standards for high resolution measurement techniques
In cooperation with PTB (Physikalisch-Technische Bundesanstalt), m2c developed new roughness standards for high resolution surface measurement techniques. The desired roughness can be selected in an easy way and is used for the production with Focussed Ion Beam (FIB). Repeated profiles, well-known in 2D roughness measurement techniques, are also suitable for this processing technology.
For more information, see:
January 1, 2016
Live 3D Topography
m2c 3D Topography (microShape) is now integrated in the DISS products of point electronic GmbH. This allows the upgrade of your SEM to a complete 3D topographic measurement system.
October 1, 2015
Best poster award
Ulrich Gernert's (TU Berlin) poster "Topographic contrast of HR-SEM" was awarded with the best poster price (Advances in Instrumentation, Detectors, FIB and Preparation) at the MC 2015 in Göttingen. For the presented evaluation of SEM image data, m2c software was enhanced with special radial histogram analysis.